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Aligned Ion Implantation Using Scanning Probes. Towards Precise Single Ion Placement for a Solid State Quantum Computer

Код 899807

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Аннотация к книге "Aligned Ion Implantation Using Scanning Probes. Towards Precise Single Ion Placement for a Solid State Quantum Computer"

A new technique for precise ion implantation has been developed using a scanning probe that has been equipped with a small aperture and incorporated into an ion beamline. Ions are passed through the aperture and implanted into a sample. By using a scanning probe the target can be imaged in a non-destructive way prior to implantation. The probe can be placed at the desired location with nanometer precision. With this approach a final placement accuracy of about 10 nm is envisioned, limited by...

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Издательство: Книга по требованию
Дата выхода: июль 2011
ISBN: 978-3-6390-4921-3
Объём: 108 страниц
Масса: 184 г
Размеры(высота, ширина, толщина), см: 23 x 16 x 1

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