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Applications of X-ray Computed Microtomography to Materials Science. Devices and Perspectives

Код 895588

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Аннотация к книге "Applications of X-ray Computed Microtomography to Materials Science. Devices and Perspectives"

The 3D visualization of the inner microstructural features of objects and materials is of relevant interest for a wide range of scientific and industrial applications. X-ray computed microtomography (?-CT) is a powerful non-destructive technique capable to satisfy these needs. This work was carried out at the hard X-ray imaging beamline of the Elettra Synchrotron Radiation Facility (Trieste, Italy). Here, the acquired experience has leaded scientists to design a complementary state-of- the-art...

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Издательство: Книга по требованию
Дата выхода: июль 2011
ISBN: 978-3-6391-7852-4
Объём: 176 страниц
Масса: 288 г
Размеры(высота, ширина, толщина), см: 23 x 16 x 1

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