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The Effect of Nuclear Reactions on Integrated Circuit Reliability. CHARGE GENERATION BY SECONDARY PARTICLES FROM NUCLEAR REACTIONS IN BACK END OF LINE MATERIALS

Код 916170

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Аннотация к книге "The Effect of Nuclear Reactions on Integrated Circuit Reliability. CHARGE GENERATION BY SECONDARY PARTICLES FROM NUCLEAR REACTIONS IN BACK END OF LINE MATERIALS"

Direct charge collection measurements are presented which prove that the presence of tungsten near sensitive volumes leads to extreme charge collection events through nuclear reactions. We demonstrate that, for a fixed incident particle linear energy transfer (LET), increasing particle energy beyond a certain point causes a decrease in nuclear reaction-induced charge collection. This suggests that a worst-case energy exists for single-event effect susceptibility, which depends on the...

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Издательство: Книга по требованию
Дата выхода: июль 2011
ISBN: 978-3-6392-4128-0
Объём: 56 страниц
Масса: 104 г
Размеры(высота, ширина, толщина), см: 23 x 16 x 1

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