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Tuning for Yield. Towards predictable deep-submicron manufacturing

Код 913136

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Аннотация к книге "Tuning for Yield. Towards predictable deep-submicron manufacturing"

This book deals primarily with methods to estimate the parametric yield of a manufactured IC in the face of process variations. Various process variation models are considered including systematic and random variations. The parametric yield is defined as the probability that the IC meets its timing constraints. In the face of process variations gate delays become random variables. The problem is first formulated as an "impulse-train" approach where gate delay distributions are discretised, so...

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Издательство: Книга по требованию
Дата выхода: июль 2011
ISBN: 978-3-6391-0218-5
Объём: 144 страниц
Масса: 239 г
Размеры(высота, ширина, толщина), см: 23 x 16 x 1

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